EPJ

Characterization of small cracks in eddy current testing

Y. Le Bihan, J. Pávó and C. Marchand

Eur. Phys. J. Appl. Phys., 43 2 (2008) 231-237

Published online: 12 June 2008

DOI: 10.1051/epjap:2008112

Y. Le Bihan

J. Pávó

C. Marchand

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