Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test Julia Vincent, Venkata Ramana Posa, Ali Khouzam, Pierre-Olivier Logerais, Mustapha El Yaakoubi and Anne Labouret EPJ Photovolt., 14 (2023) 25 Published online: 24 August 2023 DOI: 10.1051/epjpv/2023014