EPJ

An ellipsometric investigation of Ag/SiO₂ nanocomposite thin films

R. K. Roy, S. K. Mandal, D. Bhattacharyya and A. K. Pal

Eur. Phys. J. B, 34 1 (2003) 25-31

Published online: 23 July 2003

DOI: 10.1140/epjb/e2003-00192-5

R. K. Roy

S. K. Mandal

D. Bhattacharyya

A. K. Pal

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