EPJ

Full X-ray pattern analysis of vacuum deposited pentacene thin films

O. Werzer, B. Stadlober, A. Haase, M. Oehzelt and R. Resel

Eur. Phys. J. B, 66 4 (2008) 455-459

Published online: 12 December 2008

DOI: 10.1140/epjb/e2008-00452-x

O. Werzer

B. Stadlober

A. Haase

M. Oehzelt

R. Resel

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