EPJ

Study of structural and electrical properties of thin NiO_x films prepared by ion beam sputtering of Ni and subsequent thermo-oxidation

P. Horak, V. Lavrentiev, V. Bejsovec, J. Vacik, S. Danis, M. Vrnata and J. Khun

Eur. Phys. J. B, 86 11 (2013) 470

Published online: 13 November 2013

DOI: 10.1140/epjb/e2013-30969-6

P. Horak

V. Lavrentiev

V. Bejsovec

J. Vacik

S. Danis

M. Vrnata

J. Khun

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