EPJ

White light interferometry analysis for measuring thin film thickness down to a few nanometers

Victor Ziapkoff, François Boulogne, Anniina Salonen and Emmanuelle Rio

Eur. Phys. J. E, 49 1-2 (2026) 4

Published online: 19 January 2026

DOI: 10.1140/epje/s10189-025-00545-9

Victor Ziapkoff

François Boulogne

Anniina Salonen

Emmanuelle Rio

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