EPJ

Ultra-slow dynamic annealing of neutron-induced defects in n-type silicon: role of charge carriers

Ying Zhang, Yang Liu, Hang Zhou, Ping Yang, Jie Zhao and Yu Song

Eur. Phys. J. Plus, 135 10 (2020) 827

Published online: 14 October 2020

DOI: 10.1140/epjp/s13360-020-00849-z

Ying Zhang

Yang Liu

Hang Zhou

Ping Yang

Jie Zhao

Yu Song

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)