EPJ

Cu-C interface systems evaluated with the help of the thermal wave contrast

S. Chotikaprakhan, A. Haj-Daoud, D. Dietzel, R. Meckenstock, E. Neubauer, J. Pelzl and B. K. Bein

Eur. Phys. J. Special Topics, 153 (2008) 175-178

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00421-9

S. Chotikaprakhan

A. Haj-Daoud

D. Dietzel

R. Meckenstock

E. Neubauer

J. Pelzl

B. K. Bein

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