EPJ

On the non-linear dependence of photocarrier radiometry signals from Si wafers on the intensity of the laser beam

J. Tolev, A. Mandelis and M. Pawlak

Eur. Phys. J. Special Topics, 153 (2008) 317-320

Published online: 12 March 2008

DOI: 10.1140/epjst/e2008-00454-0

J. Tolev

A. Mandelis

M. Pawlak

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