EPJ

Rapid X-ray reflectivity measurement using a new liquid interface reflectometer at SPring-8

Y. F. Yano, T. Uruga, H. Tanida, H. Toyokawa, Y. Terada, M. Takagaki and H. Yamada

Eur. Phys. J. Special Topics, 167 (2009) 101-105

Published online: 05 February 2009

DOI: 10.1140/epjst/e2009-00943-6

Y. F. Yano

T. Uruga

H. Tanida

H. Toyokawa

Y. Terada

M. Takagaki

H. Yamada

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