EPJ

Resistance metrology based on the quantum Hall effect

W. Poirier and F. Schopfer

Eur. Phys. J. Special Topics, 172 (2009) 207-245

Published online: 13 June 2009

DOI: 10.1140/epjst/e2009-01051-5

W. Poirier

F. Schopfer

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