X-ray scattering by nano-particles within granular thin films, investigation by grazing angle X-ray reflectometryM. Mâaza, A. Gibaud, C. Sella, B. Pardo, F. Dunsteter, J. Corno, F. Bridou, G. Vignaud, A. Désert and A. MenelleEur. Phys. J. B, 7 3 (1999) 339-345DOI: https://doi.org/10.1007/s100510050620