Influence of acceptor impurities on semi-insulating GaAs particle detectorsR. Ferrini, G. Guizzetti, M. Patrini, F. Nava, P. Vanni and C. LanzieriEur. Phys. J. B, 16 2 (2000) 213-216DOI: https://doi.org/10.1007/s100510070221