Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradationN. Jeanvoine, A. Velichko, C. Selzner and F. MücklichEur. Phys. J. Appl. Phys., 49 2 (2010) 22907DOI: https://doi.org/10.1051/epjap/2009210