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Physico-chemical characterization of multilayer YIG thin film deposited by rf sputtering

B. Abdel Samad, M.-F. Blanc-Mignon, M. Roumie, A. Siblini, J. P. Chatelon and M. Korek

Eur. Phys. J. Appl. Phys., 50 1 (2010) 10502

DOI: https://doi.org/10.1051/epjap/2010026

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