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Novel MgO/SiO₂ double protective layers to prevent Ag mirror degradation

S.-J. Choi, K.-H. Kim, J.-H. Jo, S.-J. Kwon, S. Cho and H. Oh

Eur. Phys. J. Appl. Phys., 51 1 (2010) 10501

DOI: https://doi.org/10.1051/epjap/2010063

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