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Determination of critical island size in para-sexiphenyl islands on SiO₂ using capture-zone scaling

S. Lorbek, G. Hlawacek and C. Teichert

Eur. Phys. J. Appl. Phys., 55 2 (2011) 23902

DOI: https://doi.org/10.1051/epjap/2011100428

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