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In-plane strain states of standard and flip-chip GaN epilayers

Z. Y. Zuo, D. Liu, R. J. Wang, S. B. Qin, H. Liu and X. G. Xu

Eur. Phys. J. Appl. Phys., 54 1 (2011) 10101

DOI: https://doi.org/10.1051/epjap/2011100454

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