Effect of point defects on lattice constant in MgO thin film deposited on silicon(0 0 1) substrate - Ab initio method approach using ABINIT codeS. Kaneko, T. Nagano, T. Ito, M. Yasui, T. Ozawa, M. Soga, Y. Motoizumi, H. Funakubo and M. YoshimotoEur. Phys. J. Appl. Phys., 58 1 (2012) 10302DOI: https://doi.org/10.1051/epjap/2012110247