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Measurement and numerical analysis of C-V characteristics for normally-on SiCED-JFET

Sami Ghedira, Cyril Buttay, Hervé Morel and Kamel Besbes

Eur. Phys. J. Appl. Phys., 66 2 (2014) 20103

DOI: https://doi.org/10.1051/epjap/2014130533

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