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Effect of the RF-power and annealing on the structural, optical, morphological and electrical properties of RF-sputtered V₂O₅ thin films

Mohammed Bousseta, Lahcen Nkhaili, Abdelfattah Narjis, Abdelkader El Kissani, Abdelaziz Tchenka and Abdelkader Outzourhit

Eur. Phys. J. Appl. Phys., 97 (2022) 79

DOI: https://doi.org/10.1051/epjap/2022220081

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