Edge-Detected 4DSTEM - effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrumentNikita Denisov, Andrey Orekhov and Johan VerbeeckEur. Phys. J. Appl. Phys., 100 (2025) 5DOI: https://doi.org/10.1051/epjap/2025002