Determination of the electron mean free path in the 1–1.8 eV energy range in thin gold layers using ballistic electron emission microscopyR. Coratger, C. Girardin, R. Pechou, F. Ajustron and J. BeauvillainEur. Phys. J. AP, 5 3 (1999) 237-242DOI: https://doi.org/10.1051/epjap:1999134