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Phase segregation, Cu migration and junction formation in Cu(In, Ga)Se₂

R. Herberholz, U. Rau, H. W. Schock, T. Haalboom, T. Gödecke, F. Ernst, C. Beilharz, K. W. Benz and D. Cahen

Eur. Phys. J. AP, 6 2 (1999) 131-139

DOI: https://doi.org/10.1051/epjap:1999162

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