Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscopeR. Laddada, S. Benrezzak, P. M. Adam, G. Viardot, J. L. Bijeon and P. RoyerEur. Phys. J. AP, 6 2 (1999) 171-178DOI: https://doi.org/10.1051/epjap:1999168