The electrical activity of IMPATT diodes on a nanometric scale by X-STEBIC methodH. Maya, C. Cabanel, J.-Y. Laval, L. Peymayeche, A. de Lustrac and F. BouillautEur. Phys. J. AP, 10 1 (2000) 43-51DOI: https://doi.org/10.1051/epjap:2000118