Real-time high-resolution topographic imagery using interference microscopyA. Dubois, L. Vabre, A.-C. Boccara, P. C. Montgomery, B. Cunin, Y. Reibel and C. DramanEur. Phys. J. AP, 20 3 (2002) 169-175DOI: https://doi.org/10.1051/epjap:2002088