In-situ microscopy study of nanocavity shrinkage in Si under ion beam irradiationM.-O. Ruault, M. C. Ridgway, F. Fortuna, H. Bernas and J. S. WilliamsEur. Phys. J. AP, 23 1 (2003) 39-40DOI: https://doi.org/10.1051/epjap:2002120