Backside failure analysis of GaAs MMIC ASICsF. Beaudoin, D. Carisetti, J. C. Clement, R. Desplats and P. PerduEur. Phys. J. Appl. Phys., 27 1-3 (2004) 475-477DOI: https://doi.org/10.1051/epjap:2004081