Mapping of minority carrier diffusion length and heavy metal contamination with ultimate surface photovoltage methodJ. Lagowski, A. Aleynikov, A. Savtchouk and P. EdelmanEur. Phys. J. Appl. Phys., 27 1-3 (2004) 503-506DOI: https://doi.org/10.1051/epjap:2004121