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Strain effects of InP/Si and InP/porous Si studied by spectroscopic ellipsometry

M. Lajnef, N. Ben Sedrine, J. C. Harmand, L. Travers, H. Ezzaouia and R. Chtourou

Eur. Phys. J. Appl. Phys., 42 2 (2008) 99-102

DOI: https://doi.org/10.1051/epjap:2008042

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