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Focussing of a transient low energy Cs⁺ probe for improved NanoSIMS characterizations - Study of charged particle optics

M. Bernheim, T. D. Wu, J. L. Guerquin-Kern and A. Croisy

Eur. Phys. J. Appl. Phys., 42 3 (2008) 311-319

DOI: https://doi.org/10.1051/epjap:2008062

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