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Microstructural characterization of porous silicon for use in optoelectronic devices

D. Abidi, S. Romdhane, A. Brunet-Bruneau and J.-L. Fave

Eur. Phys. J. Appl. Phys., 45 1 (2009) 10601

DOI: https://doi.org/10.1051/epjap:2008192

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