AES, EELS and TRIM simulation method study of InP(100) subjected to Ar+, He+ and H+ ions bombardment.M. Ghaffour, A. Abdellaoui, M. Bouslama, A. Ouerdane and B. AbidriEPJ Web of Conferences, 29 (2012) 00020DOI: https://doi.org/10.1051/epjconf/20122900020