Probing buried interfaces in SiOxNy thin films via ultrafast acoustics: The role transducing layer thicknessMartina Tauchmanová, Pavel Mokrý, Vít Kanclíř, Jan Václavík, Petra Veselá and Karel ŽídekEPJ Web Conf., 287 (2023) 05014DOI: https://doi.org/10.1051/epjconf/202328705014