Impact of high-temperature processing steps on the long-term stability of charge carrier lifetime in n-type FZ-siliconMelanie Mehler, Nicolas Weinert, Nicole Aßmann, Axel Herguth, Giso Hahn and Fabian GemlEPJ Photovolt., 16 (2025) 15DOI: https://doi.org/10.1051/epjpv/2025006