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Étude par spectroscopie d'admittance et MEB de la dégradation électrique des couches minces de CuAlS₂ non dopé déposées sous vide

N. Helali, B. Bouricha and B. Rezig

Eur. Phys. J. AP, 3 1 (1998) 9-19

DOI: https://doi.org/10.1051/epjap:1998198

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