Gate recess study for high thermal stability pHEMT devicesM. Mohamad Isa, N. Ahmad, Siti S. Mat Isa, Muhammad M. Ramli, N. Khalid, N.I. M. Nor, S.R. Kasjoo and M. MissousEPJ Web Conf., 162 (2017) 01047DOI: https://doi.org/10.1051/epjconf/201716201047