Signature inversion phenomena in odd-odd
Y.H. Zhang, F.R. Xu, J.J. He, Z. Liu, X.H. Zhou, Z.G. Gan, T. Hayakawa, M. Oshima, T. Toh, T. Shizuma, J. Katakura, Y. Hatsukawa, M. Matsuda, H. Kusakari, M. Sugawara, K. Furuno, T. Komatsubara, T. Une, S.X. Wen and Z.M. Wang
Eur. Phys. J. A, 14 3 (2002) 271-274
DOI: https://doi.org/10.1140/epja/i2002-10041-9