In-beam Mössbauer study of using a secondary beam and ion implantation Y. Kobayashi, Y. Yoshida, M.K. Kubo, Y. Yamada, A. Yoshida, H. Ogawa, H. Ueno and K. AsahiEur. Phys. J. A, 13 1-2 (2002) 243-246DOI: https://doi.org/10.1007/s10050-002-8750-0