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RDDS lifetime measurement with JUROGAM + RITU

T. Grahn, A. Dewald, O. Möller, C. W. Beausang, S. Eeckhaudt, P. T. Greenlees, J. Jolie, P. Jones, R. Julin, S. Juutinen, H. Kettunen, T. Kröll, R. Krücken, M. Leino, A. -P. Leppänen, P. Maierbeck, D. A. Meyer, P. Nieminen, M. Nyman, J. Pakarinen, P. Petkov, P. Rahkila, B. Saha, C. Scholey and J. Uusitalo
Eur. Phys. J. A, 25 (2005) 441-442
DOI: https://doi.org/10.1140/epjad/i2005-06-024-2


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