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Mechanism of grain-boundary magnetoresistance in Fe₃O₄ films

M. Ziese, R. Höhne, H. C. Semmelhack, H. Reckentin, N. H. Hong and P. Esquinazi

Eur. Phys. J. B, 28 4 (2002) 415-422

DOI: https://doi.org/10.1140/epjb/e2002-00245-3

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