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An ellipsometric investigation of Ag/SiO₂ nanocomposite thin films

R. K. Roy, S. K. Mandal, D. Bhattacharyya and A. K. Pal

Eur. Phys. J. B, 34 1 (2003) 25-31

DOI: https://doi.org/10.1140/epjb/e2003-00192-5

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