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Stochastic analysis of different rough surfaces

M. Waechter, F. Riess, Th. Schimmel, U. Wendt and J. Peinke

Eur. Phys. J. B, 41 2 (2004) 259-277

DOI: https://doi.org/10.1140/epjb/e2004-00317-4

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