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Spectroscopic ellipsometric evidence of the solid-state reactions in Ni/Si multilayered films, induced by ion-beam mixing and thermal annealing

Y. P. Lee, Y. V. Kudryavtsev, Y. N. Makogon, E. P. Pavlova and J. Y. Rhee

Eur. Phys. J. B, 44 4 (2005) 431-438

DOI: https://doi.org/10.1140/epjb/e2005-00142-3

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