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Exchange bias on epitaxial Ni films due to ultrathin NiO layer

R. A. Lukaszew, M. Mitra, Z. Zhang and M. Yeadon

Eur. Phys. J. B, 45 2 (2005) 181-184

DOI: https://doi.org/10.1140/epjb/e2005-00183-6

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