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Smearing origin of zero-bias conductance peak in Ag-SiO-Bi2Sr2CaCu2O8+δ planar tunnel junctions: influence of diffusive normal metal verified with the circuit theory

Eur. Phys. J. B, 54 2 (2006) 141-149
DOI: https://doi.org/10.1140/epjb/e2006-00440-2


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