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Individual charge traps in silicon nanowires - Measurements of location, spin and occupation number by Coulomb blockade spectroscopy

M. Hofheinz, X. Jehl, M. Sanquer, G. Molas, M. Vinet and S. Deleonibus

Eur. Phys. J. B, 54 3 (2006) 299-307

DOI: https://doi.org/10.1140/epjb/e2006-00452-x

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EPJ A Topical Collection devoted to the legacy of Peter Schuck
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EPJ B Topical Issue: Advances in Complex Systems
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