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Residual strain measurements in InGaAs metamorphic buffer layers on GaAs

V. Bellani, C. Bocchi, T. Ciabattoni, S. Franchi, P. Frigeri, P. Galinetto, M. Geddo, F. Germini, G. Guizzetti, L. Nasi, M. Patrini, L. Seravalli and G. Trevisi

Eur. Phys. J. B, 56 3 (2007) 217-222

DOI: https://doi.org/10.1140/epjb/e2007-00105-8

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