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Investigation of Cu_0.5Ni_0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

S. Y. Huang, J. J. Liang, S. Y. Hsu, L. K. Lin, T. C. Tsai and S. F. Lee

Eur. Phys. J. B, 79 2 (2011) 153-162

DOI: https://doi.org/10.1140/epjb/e2010-10051-y

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